QT-6000 SeriesHi-Speed Discrete Test System QT-6000
广西快乐10分怎样开奖号码 www.fetva.icu QT-6000 Test System with built-in capacitance test (DC+CAP) and Scanbox etc is applicable to devices like medium & small power transistors MOS-FET diodes and Wafer.
• Hi-speed test to match Handler with UPH above 56K.
• FT/QA retest can mostly prevent test escapee.
• Available parallel test to achieve multi-channel and multi-die test.
QT-6166 is able to perform 8 pcs of transistors ping-pong test in
one time and test time for 4 transistors in parallel test is about 40ms.