QT-9000 Series
VLSI Test System QT-9000
QT-8000 Series
Analog & Digital Mixed Signal IC test System (Cable Mount) QT-8100
Analog & Digital Mixed Signal IC Test System (Direct Mount) QT-8200
Analog & Digital Mixed Signal IC Test System QT-8100HP
QT-7000 Series
IC Test System QT-7100
Digital IC Test System QT-7200
QT-6000 Series
Hi-Speed Discrete Test System QT-6000
QT-5000 Series
Semiconductor Discrete Test System QT-5000
QT-4000 Series
Semiconductor Discrete Test System QT-4000
General Test System TB-14
QT-3000 Series
EAS Test System QT-3101B
Thermal Resistance Test System QT-3102
MOSFET RG/CG Test System QT-3107-25

Test System

QT-6000 SeriesHi-Speed Discrete Test System QT-6000

广西快乐10分通5遗漏:Hi-Speed Discrete Test System QT-6000

广西快乐10分怎样开奖号码 www.fetva.icu QT-6000 Test System with built-in capacitance test (DC+CAP) and Scanbox etc is applicable to devices like medium & small power transistors MOS-FET diodes and Wafer.


Application Features
• Hi-speed test to match Handler with UPH above 56K.
• FT/QA retest can mostly prevent test escapee.
• Available parallel test to achieve multi-channel and multi-die test.
QT-6166 is able to perform 8 pcs of transistors ping-pong test in
one time and test time for 4 transistors in parallel test is about 40ms.


QT-6166 can ping pong test 8 transistors, the test time for 4 transistor in 
parallel test is about 40ms.

Major Technical Parameters

Do more for semicon China

No.16 Guangming Ave., Guangdong New Light
Source Industrial Base,Luocun,Nanhai District,
Tel:+86 757 83207313
Fax:+86 757 83208786

PowerTECH Worldwide

The company has developed its reputation and gained significant market share in China and Asia.

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