QT-4000 SeriesDiscrete Device Test System QT-4100
广西快乐10分怎样开奖号码 www.fetva.icu QT-4100 discrete device test system is applied to triode diode Zener diode MOS-FET(IGBT) J-FET Current Sense FET LDO (78XX 79XX TL431 TL432 regular test) photoelectric coupler and wafer etc. and may extend to some special applications: Silicon controlled test SCANBOX Dual Gate-FET Q Plus Triode switching time test (TST TR TF TON) and RTH test(DVDS DVCE DVBE DVF).
• High test coverage, circuit work under retrained current and voltage which could protect DUT effectively.
• Fool proof test: Quick self-diagnosis for current and voltage test and automatic stop and alarm in abnormal running.
• Low RDON: Test 1mV voltage with deviation less than 30uV, test 10mV voltage or above with deviation less than 0.5%.
• Quick self-test: Self-test finish in 2 minutes without external device.
• Calibration: Agilent 34401A.
• Built-in oscilloscope.
• Support multi-station data consolidation.
Major Technical Parameters